Former group member (Ph.D., 2011).
LinkedIn profile
Publications with the Performability Engineering Research Group
The Möbius Modeling Environment: Recent Extensions – 2005.
T. Courtney, S. Derisavi, S. Gaonkar, M. Griffith, V. Lam, M. McQuinn, E. Rozier, and W. H. Sanders. (05COU02)
Proceedings of the 2nd International Conference on the Quantitative Evaluation of Systems (QEST 2005), Torino, Italy, September 19-22, 2005, pp. 259-260. [IEEE Xplore entry]
Data Analysis and Visualization within the Möbius Modeling Environment.
T. Courtney, S. Gaonkar, M. Griffith, V. Lam, M. McQuinn, E. Rozier, and W. H. Sanders. (06COU01)
Proceedings of the 3rd International Conference on the Quantitative Evaluation of SysTems (QEST), Riverside, CA, Sept. 11-14, 2006, pp. 137-138. [IEEE Xplore entry]
Design of Experiments within the Möbius Modeling Framework.
T. Courtney, S. Gaonkar, M. G. McQuinn, E. Rozier, W. H. Sanders, and P. Webster. (07COU01)
Proceedings of the 4th International Conference on the Quantitative Evaluation of SysTems (QEST) 2007, Edinburgh, UK, Sept. 16-19, 2007, pp. 161-162. [IEEE Xplore entry]
Scaling File Systems to Support Petascale Clusters: A Dependability Analysis to Support Informed Design Choices.
S. Gaonkar, E. Rozier, A. Tong, and W. H. Sanders. (08GAO04)
University of Illinois at Urbana-Champaign Coordinated Science Laboratory technical report UILU-ENG-08-2202 (CRHC-08-01), January 2008.
Scaling File Systems to Support Petascale Clusters: A Dependability Analysis to Support Informed Design Choices.
S. Gaonkar, E. Rozier, A. Tong, and W. H. Sanders. (08GAO01)
Proceedings of the 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2008), Anchorage, Alaska, June 24-27, 2008, pp. 386-391. [IEEE Xplore entry]
Möbius 2.3: An Extensible Tool for Dependability, Security, and Performance Evaluation of Large and Complex System Models.
T. Courtney, S. Gaonkar, K. Keefe, E. W. D. Rozier, and W. H. Sanders. (08COU01)
Proceedings of the 39th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2009), Estoril, Lisbon, Portugal, June 29-July 2, 2009, pp. 353-358. [IEEE Xplore entry]
Evaluating the Impact of Undetected Disk Errors in RAID Systems.
E. W. D. Rozier, W. Belluomini, V. Deenadhayalan, J. Hafner, K. K. Rao, and P. Zhou. (09ROZ01)
Proceedings of the 39th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), Estoril, Lisbon, Portugal, June 29-July 2, 2009, pp. 83-92. [IEEE Xplore entry]
Performance and Dependability Modeling with Möbius.
S. Gaonkar, K. Keefe, R. Lamprecht, E. Rozier, P. Kemper, and W. H. Sanders. (08GAO03)
ACM SIGMETRICS Performance Evaluation Review, vol. 36, no. 4, March 2009, pp. 16-21. [ACM DOI: http://dx.doi.org/10.1145/1530873.1530878]
Remote Job Management in the Möbius Modeling Framework.
K. Keefe, Q. Mitchell, E. Rozier, and W. H. Sanders. (09GUL01)
Proceedings of the 6th International Conference on Quantitative Evaluation of SysTems (QEST) 2009, Budapest, Hungary, September 13-16, 2009, pp. 209-210. [IEEE Xplore entry]
Dependency-Based Decomposition of Systems Involving Rare Events.
E. W. D. Rozier and W. H. Sanders. (10ROZ03)
University of Illinois at Urbana-Champaign Coordinated Science Laboratory technical report UILU-ENG-11-2203 (CRHC-11-03), January 2011.
Modeling the Fault Tolerance Consequences of Deduplication.
E. W. D. Rozier, W. H. Sanders, P. Zhou, N. Mandagere, S. M Uttamchandani, and M. L. Yakushev. (11ROZ02)
Proceedings of the 30th IEEE Symposium on Reliable Distributed Systems (SRDS 2011), Madrid, Spain, October 5-7, 2011, pp. 75-84. [IEEE Xplore entry]
Understanding the Fault-Tolerance Properties of Large-Scale Storage Systems.
E. W. D. Rozier. (11ROZ03)
Ph.D. Dissertation, University of Illinois at Urbana-Champaign, 2011.
A Framework for Efficient Evaluation of the Fault Tolerance of Deduplicated Storage Systems.
E. W. D. Rozier and W. H. Sanders. (11ROZ04)
Proceedings of the 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN-2012), Boston, Massachusetts, USA, June 25-28, 2012, pp. 1-12. [IEEE Xplore entry]
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