Former group member (Ph.D., 2002).
LinkedIn profile
Publications with the Performability Engineering Research Group
A Dynamic Replica Selection Algorithm for Tolerating Timing Faults.
S. Krishnamurthy, W. H. Sanders, and M. Cukier. (00KRI01)
Proceedings of the International Conference on Dependable Systems and Networks (DSN-2001), Göteborg, Sweden, July 1-4, 2001, pp. 107-116. [IEEE Xplore entry]
Performance Evaluation of a Probabilistic Replica Selection Algorithm.
S. Krishnamurthy, W. H. Sanders, and M. Cukier. (01KRI02)
Proceedings of the 7th IEEE International Workshop on Object-oriented Real-time Dependable Systems (WORDS 2002), San Diego, California, January 7-9, 2002, pp. 119-127. [IEEE Xplore entry]
Performance Evaluation of a QoS-Aware Framework for Providing Tunable Consistency and Timeliness.
S. Krishnamurthy, W. H. Sanders, and M. Cukier. (02KRI02)
Proceedings of the 2002 10th IEEE International Workshop on Quality of Service (IWQoS 2002), Miami Beach, Florida, May 15-17, 2002, pp. 214-223. [IEEE Xplore entry]
An Adaptive Framework for Tunable Consistency and Timeliness Using Replication.
S. Krishnamurthy, W. H. Sanders, and M. Cukier. (01KRI03)
Proceedings of the 2002 International Conference on Dependable Systems and Networks (DSN-2002), Washington, DC, June 23-26, 2002, pp. 17-26. [IEEE Xplore entry]
A Configurable CORBA Gateway for Providing Adaptable System Properties.
M. Seri, T. Courtney, M. Cukier, V. Gupta, S. Krishnamurthy, J. Lyons, H. Ramasamy, J. Ren, and W. H. Sanders. (02SER01)
Supplemental Volume of the 2002 International Conference on Dependable Systems & Networks (DSN-2002), Washington, DC, June 23-26, 2002, pp. G-26 to G-30.
An Adaptive Quality of Service Aware Middleware for Replicated Services.
S. Krishnamurthy. (02KRI04)
Ph.D. Thesis, University of Illinois, 2002.
An Adaptive Quality of Service Aware Middleware for Replicated Services.
S. Krishnamurthy, W. H. Sanders, and M. Cukier. (02KRI05)
IEEE Transactions on Parallel and Distributed Systems, vol. 14, no. 11, November 2003, pp. 1112-1125. [IEEE Xplore entry]
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